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dc.contributor.authorItagaki, Kazuhiko-
dc.descriptionCRREL Report-
dc.descriptionAbstract: The contribution of electrically charged dislocation motion to dielectric relaxation was studied theoretically. Experimentally obtained data on charge density, dislocation density, and segment length and distribution described in Part I of this series were used to calculate dielectric relaxation spectra. The results indicate that the charged dislocation process can produce the observed audio frequency dielectric relaxation as well as the distribution of spectra.-
dc.publisherCold Regions Research and Engineering Laboratory (U.S.)-
dc.publisherEngineer Research and Development Center (U.S.)-
dc.relation.ispartofseriesCRREL report ; 82-7.-
dc.rightsApproved for public release; distribution is unlimited.-
dc.sourceThis Digital Resource was created from scans of the Print Resource-
dc.subjectDielectric strength-
dc.subjectDielectric relaxation-
dc.subjectElectric charge-
dc.subjectElectric distribution-
dc.subjectSingle crystals-
dc.titleCharged dislocation in ice. II, contribution of dielectric relaxation-
Appears in Collections:CRREL Report

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