Please use this identifier to cite or link to this item: https://hdl.handle.net/11681/40842
Title: Finite element analysis of quoin block deterioration and load transfer mechanisms in miter gates : pintle and pintle connections
Authors: Dixon, DeAnna L.
Hodo, Wayne D.
Keywords: Locks (Hydraulic engineering)--Maintenance and repair
Hydraulic structures
Structural analysis (Engineering)
Hydraulic gates--Structural failures
Finite element method
Publisher: Information Technology Laboratory (U.S.)
Geotechnical and Structures Laboratory (U.S.)
Engineer Research and Development Center (U.S.)
Series/Report no.: Technical Report (Engineer Research and Development Center (U.S.)) ; no. ERDC TR-21-9
Abstract: The U.S. Army Corps of Engineers (USACE) currently operates and maintains approximately 193 commercially active lock sites with 239 locks and dams spanning nearly 12,000 miles. These networks of water channels are used to transport 600 million tons of domestic cargo, generating $405 billion in revenue annually. Nearly 60% of these structures in operation are over 50 years old and have reached design life. A failure of the miter gates could result in a major negative impact on the economy and on the ability to maintain flood control. Administrators need recommendations to better prioritize maintenance and repair of the USACE miter gates. This work investigated the influence of miter gate’s quoin block degradation on load transfer to the pintle and/or pintle connections. Results of finite element analysis are reported for the quoin block degradation simulated levels of 0%, 25%, 50%, and 75%. The parametric study shows the overstressed regions are the pintle neck and bolt-hole regions. To improve pintle designs so they may better mitigate detrimental environmental based deterioration effects, this work recommends (1) increasing the thickness of the bolt-hole connection region and (2) adding ribbing reinforcement around the neck area of the pintle.
Description: Technical Report
Gov't Doc #: ERDC TR-21-9
Rights: Approved for Public Release; Distribution is Unlimited
URI: https://hdl.handle.net/11681/40842
http://dx.doi.org/10.21079/11681/40842
Appears in Collections:Technical Report

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