Please use this identifier to cite or link to this item:
Title: Techniques for measuring substrate embeddedness
Authors: Sylte, Traci
Fischenich, Craig
Publisher: U. S. Army Engineer Research and Developmen Center
Description: Technical note
Appears in Collections:Technical Note - Ecosystem Management and Restoration Research Program

Files in This Item:
File Description SizeFormat 
TN-EMRRP-SR-36.pdf203.49 kBAdobe PDFThumbnail