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Title: Determination of nanomaterials’ film thickness using filmetrics F40-UV thin-film analyzer; Standard Operating Procedure Series : Characterization (C)
Authors: Wu, Qihua.
Kremer, Kathryn.
Gibbons, Stephen.
Keywords: Extinction coefficient
Nanomaterial thin-film
Optical constant
Optical measurement techniques
Refractive index
Publisher: Environmental Laboratory (U.S.)
Engineer Research and Development Center (U.S.)
Series/Report no.: Contract Report (Engineer Research and Development Center (U.S.)) ; no. ERDC/EL CR-19-1
Abstract: Optical measurement techniques have been widely used for the determination of thin film thicknesses and optical constants. This standard operating procedure (SOP) presents a specific protocol for the determination of nanomaterial thin-film thicknesses and their optical constants — including the refractive index (RI) and the extinction coefficient — using a Filmetrics F40-UV Thin Film Analyzer. Procedures and recommendations of instrument preparation and parameters, sample measurement, and results analysis are included. The procedure applies to a wide range of nanomaterial thin films in the thickness range from approximately 4 nm to 25 μm.
Description: Contract Report
Gov't Doc #: ERDC/EL CR-19-1
Rights: Approved for Public Release; Distribution is Unlimited
Size: 19 pages / 1.243 Mb
Types of Materials: PDF
Appears in Collections:Contract Report

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