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https://hdl.handle.net/11681/33627| Title: | Determination of nanomaterials’ film thickness using filmetrics F40-UV thin-film analyzer; Standard Operating Procedure Series : Characterization (C) |
| Authors: | Wu, Qihua. Kremer, Kathryn. Gibbons, Stephen. |
| Keywords: | Extinction coefficient Nanomaterial thin-film Optical constant Optical measurement techniques Refractive index |
| Publisher: | Environmental Laboratory (U.S.) Engineer Research and Development Center (U.S.) |
| Series/Report no.: | Contract Report (Engineer Research and Development Center (U.S.)) ; no. ERDC/EL CR-19-1 |
| Abstract: | Optical measurement techniques have been widely used for the determination of thin film thicknesses and optical constants. This standard operating procedure (SOP) presents a specific protocol for the determination of nanomaterial thin-film thicknesses and their optical constants — including the refractive index (RI) and the extinction coefficient — using a Filmetrics F40-UV Thin Film Analyzer. Procedures and recommendations of instrument preparation and parameters, sample measurement, and results analysis are included. The procedure applies to a wide range of nanomaterial thin films in the thickness range from approximately 4 nm to 25 μm. |
| Description: | Contract Report |
| Gov't Doc #: | ERDC/EL CR-19-1 |
| Rights: | Approved for Public Release; Distribution is Unlimited |
| URI: | https://hdl.handle.net/11681/33627 http://dx.doi.org/10.21079/11681/33627 |
| Size: | 19 pages / 1.243 Mb |
| Types of Materials: | |
| Appears in Collections: | Contract Report |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| ERDC-EL CR-19-1.pdf | 1.27 MB | Adobe PDF |  View/Open |