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Collection's Items (Sorted by Submit Date in Descending order): 1 to 1 of 1
Issue DateTitleAuthor(s)
2019-07Determination of nanomaterials’ film thickness using filmetrics F40-UV thin-film analyzer; Standard Operating Procedure Series : Characterization (C)Wu, Qihau.; Kremer, Kathryn.; Gibbons, Stephen.
Collection's Items (Sorted by Submit Date in Descending order): 1 to 1 of 1