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Title: Pattern classification techniques applied to high resolution, synthetic aperture radar imagery
Authors: Hevenor, Richard A.
Chen, Pi-Fuay.
Keywords: Radar imagery
Pattern recognition
Publisher: U.S. Army Engineer Topographic Laboratories.
Engineer Research and Development Center (U.S.)
Series/Report no.: ETL ; 0443.
Description: Report
Abstract: This report describes the application of 10 pattern classification techniques to selected samples of high resolution1 synthetic aperture radar imagery taken over the Huntsville, Alabama area. Sections of the radar imagery were digitized and stored on a digital disk unit. A Lexidata system 3400 image processor and a Hewlett Packard 1000 computer were used to display the images on a cathode ray tube and to take 100 samples for each of four terrain classes from the imagery. The 400 image samples were then used as training sets to derive the 10 classifiers. Once the classifiers were derived, the training set data were then used as input to the classifiers to see how well each would do in classifying the original training sets.
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