Please use this identifier to cite or link to this item: https://hdl.handle.net/11681/2363
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dc.contributor.authorCoastal Engineering Research Center (U.S.)-
dc.date.accessioned2016-03-11T20:51:24Z-
dc.date.available2016-03-11T20:51:24Z-
dc.date.issued1985-03-
dc.identifier.urihttp://hdl.handle.net/11681/2363-
dc.descriptionTechnical note-
dc.descriptionBACKGROUND: The basic steps listed by Issacson and Mackenzie (1981) provide a good outline for the extrapolation of long-term wave conditions. These steps are listed below. 1.Data made up of significant wave heights and periods are collected or hindcast over a period of time at the site of interest. 2.A plotting formula is used to estimate the long-term probability distribution of wave heights. 3.The results from step 2 are plotted on probability scales corresponding to several given probability distributions. Some of the most commonly used distributions are the Extremal Types I and II, the Weibull, and the Lognormal. 4.For the probability scale that exhibits the best linear plot, a least squares line is fitted through the points to represent the probability distribution for long-term wave conditions. 5.Values of significant wave height or related measures are read from the plotted line for return periods beyond the extent of the observed data. These values are called extrapolated or estimated long-term wave conditions.-
dc.publisherCoastal Engineering Research Center (U.S.)-
dc.publisherEngineer Research and Development Center (U.S.)-
dc.relationhttp://acwc.sdp.sirsi.net/client/en_US/search/asset/1000116-
dc.relation.ispartofseriesCoastal engineering technical note ; CETN-I-5.-
dc.rightsApproved for public release; distribution is unlimited.-
dc.sourceThis Digital Resource was created from scans of the Print Resource.-
dc.subjectClimatological events-
dc.subjectExtrapolation-
dc.subjectReliability-
dc.subjectValidity-
dc.subjectWave conditions-
dc.subjectWave height-
dc.titleReliability of long-term wave conditions predicted with data sets of short duration-
dc.typeReporten_US
Appears in Collections:Technical Note

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